@inproceedings{3f1dc1272c28497a861f3ee9058cef7f,
title = "Comparison of person tracking algorithms using overhead view implemented in OpenCV",
abstract = "As computer based technologies are growing rapidly, new problems are arising, which need serious and urgent attentions. Person tracking is one of the typical computer vision problem which is the center of interest for researchers working on surveillance systems (industries, shopping malls, educational institutions and hospitals etc. In this research work, a top view camera has been installed with a wide angle lens able to cover a wide area and more information for surveillance and visual monitoring purposes. Some of the common issues that are addressed in this research work are occlusion, sudden change in movement, tracking standstill body, abrupt change in direction, varying lightening conditions and differentiating a person from other objects. In this paper, different tracking algorithms are compared on a newly developed dataset using OpenCV. These algorithms are pre-implemented in the popular OpenCV library. The results and efficiency of these algorithms on a new data set are also discussed. All these algorithms give different results on overhead and frontal view video sequences.",
keywords = "Computer Vision, OpenCV., Person tracking, Top view, Video surveillance",
author = "Kaleem Ullah and Imran Ahmed and Misbah Ahmad and Iqbal Khan",
note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 9th Annual Information Technology, Electromechanical Engineering and Microelectronics Conference, IEMECON 2019 ; Conference date: 13-03-2019 Through 15-03-2019",
year = "2019",
month = mar,
doi = "10.1109/IEMECONX.2019.8877025",
language = "English (UK)",
series = "IEMECON 2019 - 9th Annual Information Technology, Electromechanical Engineering and Microelectronics Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "284--289",
editor = "Satyajit Chakrabarti and Aniruddha Mukherjee",
booktitle = "IEMECON 2019 - 9th Annual Information Technology, Electromechanical Engineering and Microelectronics Conference",
address = "United States",
}