Ninety years after Lewin: The role of familism and attachment style in social networks characteristics across 21 nations/areas

Xian Zhao, Omri Gillath, Itziar Alonso-Arbiol, Amina Abubakar, Byron G. Adams, Frédérique Autin, Audrey Brassard, Rodrigo J. Carcedo, Or Catz, Cecilia Cheng, Tamlin S. Conner, Tasuku Igarashi, Konstantinos Kafetsios, Shanmukh Kamble, Gery Karantzas, Rafael Emilio Mendía-Monterroso, João M. Moreira, Tobias Nolte, Willibald Ruch, Sandra SebreAngela Suryani, Semira Tagliabue, Qi Xu, Fang Zhang

Research output: Contribution to journalArticlepeer-review

Abstract

Drawing on the literature on person-culture fit, we investigated how culture (assessed as national-level familism), personality (tapped by attachment styles) and their interactions predicted social network characteristics in 21 nations/areas (N = 2977). Multilevel mixed modeling showed that familism predicted smaller network size but greater density, tie strength, and multiplexity. Attachment avoidance predicted smaller network size, and lower density, tie strength, and multiplexity. Attachment anxiety was related to lower density and tie strength. Familism enhanced avoidance’s association with network size and reduced its association with density, tie strength, and multiplexity. Familism also enhanced anxiety’s association with network size, tie strength, and multiplexity. These findings contribute to theory building on attachment and culture, highlight the significance of culture by personality interaction for the understanding of social networks, and call attention to the importance of sampling multiple countries.

Original languageEnglish
JournalJournal of Social and Personal Relationships
DOIs
Publication statusAccepted/In press - 2024

Keywords

  • Attachment
  • familism
  • person-culture fit
  • social network

Fingerprint

Dive into the research topics of 'Ninety years after Lewin: The role of familism and attachment style in social networks characteristics across 21 nations/areas'. Together they form a unique fingerprint.

Cite this